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5082-3188 डेटा पत्रक PDF( Datasheet डाउनलोड )


डेटा पत्रक - PIN Diodes - HP

भाग संख्या 5082-3188
समारोह PIN Diodes
मैन्युफैक्चरर्स HP 
लोगो HP लोगो 
पूर्व दर्शन
1 Page
		
<?=5082-3188?> डेटा पत्रक पीडीएफ

5082-3188 pdf
Burn-In and Storage
Test
High Temperature Life
Steady State Operating Life
Test Conditions
1,000 hrs. min. storage time @ 150°C
1,000 hrs.min. operatingtime @PFM = 250 mW,
VRM = 20 V, f = 60 Hz, TA = 25°C
LTPD/
1000 Hours
3
3
Environmental
Test
Solderability
Temperature Cycling
Thermal Shock
Moisture Resistance
Shock
Vibration Fatigue
Vibration Variable
Frequency
Constant Acceleration
Terminal Strength
Salt Atmosphere
MIL-STD-750
2026
1051
1056
1021
2026
2046
2056
2006
2036
1041
Tests Conditions
Sn 95, Pb 5, solder at 260°C
100 cycles from -65°C to +150°C, 0.5 hrs. at
extremes, 5 min. transfer.
5 cycles from 0°C to +100°C, 3 sec. transfer
10 days, 90-98% RH, -10 to +65°C, non operating
5 blows each X1, Y1, Y2, 1500 G. 0.5 msec pulse
32 ± 8 hrs., each X, Y, Z, 96 hr. total,
60 Hz, 20 G min.
4, 4 minute cycles each X, Y, Z at 20 G min.
100 to 2000 Hz
1 minute each X1, Y1, Y2, at 20,000 G
Miniature glass package, -3, 90° arcs, 2 leads,
8 oz., lead restriction
35° fog for 24 hours
DOD-HDBK-1686 ESD
Classification:
IN5767
Class II
5082-3080 Class II
5082-3188 Class I
LTPD
10
7
7
7
7
7
7
7
7
7
2-110

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डाउनलोड[ 5082-3188 Datasheet.PDF ]


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